AFM for 2DM studies in the inert environments.

Description

The project aims to study a broad range of air-sensitive 2D materials and their heterostructures, and perform scanning probe studies of their mechanical, electronic and chemical properties tested simultaneously using a state-of-the-art scanning probe instrument. The proposed platform must include a variety of Atomic Force Microscopy (AFM) modes (cAFM, EFM, PFM, Force Curves, KpFM, friction AFM, Youngs modulus measurements, non-invasive topography, nanomanipulation and nanolithography) and allow their use in an inert gas environment, such as argon or nitrogen with Lot 1: The system must be fully compatible with an argon-filled glovebox of internal workspace dimensions: 1250 mm (W) x 780 mm (D) x 900 mm (H) and fitted with anti-vibration optical table to support the AFM system. In avoidance of doubt, the system must perform as specified below in the Minimum Outcome Specifications when operated under an inert argon or nitrogen filled atmosphere with